Content-Type: |
text/plain; charset="ISO-8859-1" |
Sender: |
|
Subject: |
|
From: |
|
Date: |
Tue, 5 Oct 1999 08:42:04 +0200 |
MIME-Version: |
1.0 |
X-To: |
|
Reply-To: |
|
Parts/Attachments: |
|
|
Edward,
we have found that there is nothing better than ordinary stoneaged crossectioning and study in a metalographic microscope. In mass production, samples are usually enough. Such examinations don't take time and they tell a lot more than betascope. And...you can store the images and have a look back up and then.
Regards
Ingemar Hernefjord
Ericsson Microwave Systems
I am looking after alternative method of measuring of electroplated Gold
over Nickel for production .Gold thickness is in range from 0.75 to 2.5
microns.
I have in my plant beta scope with Promethium source with lot of problems.I
have also XRF,that can not be placed in production area.
Any sugestions?
Edward Szpruch
Eltek , Manager of Process Engineering
P.O.Box 159 ; 49101 Petah Tikva Israel
Tel ++972 3 9395050 , Fax ++972 3 9309581
e-mail [log in to unmask]
##############################################################
TechNet Mail List provided as a free service by IPC using LISTSERV 1.8c
##############################################################
To subscribe/unsubscribe, send a message to [log in to unmask] with following text in
the body:
To subscribe: SUBSCRIBE TECHNET <your full name>
To unsubscribe: SIGNOFF TECHNET
##############################################################
Please visit IPC web site (http://www.ipc.org/html/forum.htm) for additional
information.
If you need assistance - contact Gayatri Sardeshpande at [log in to unmask] or
847-509-9700 ext.5365
##############################################################
|
|
|