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September 1999

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Subject:
From:
"Ingemar Hernefjord (EMW)" <[log in to unmask]>
Reply To:
TechNet E-Mail Forum.
Date:
Mon, 20 Sep 1999 09:17:53 +0200
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Hi, mate,
you will find everything about electromigration  in 'ASM Handbook Volume 13 Corrosion' ISBN 0-87170-007-7, couldn't be without that book. You can knock robbers with it also (weighs a lot), practical tips. Good Luck.
Ingemar Hernefjord
Ericsson Microwave Systems

PS. These expressions are very confusing. According to one source  'electromigration' is a phenomenon caused in a conductor in such a way that you get vacancies in one part of the conductor and excess in another part, the result being that the conductor can stop being a good conductor. Others call this 'metal migration'. I have seen many horrowful and strange things coming from different parts of the world, and every case seems to be a little unique. If you describe the problem more precisely, I may give you some further input.


-----Original Message-----
From: Glenn Pelkey [mailto:[log in to unmask]]
Sent: den 17 september 1999 20:53
To: [log in to unmask]
Subject: Re: [TN] DC 160, electromigration


Electromigration as defined by the transport of metal atoms along interfaces,
between grains, and leaving a void.  Influenced by temperature and current
density.  The temperature activation energy I have listed for aluminium is 0.5
eV  (although, other authors list 0.4 to 0.5 eV, 0.4 to 0.8).  Other metals
list a range of 0.5 to 1.2 eV.

Electromigration as defined by the transport of metal ions across an
insulating surface forming a conductive path.  Also called Electrochemical
Migration, Ionic Migration, or Electrolytic Corrosion.  Requires some level of
moisture and voltage potential, and may require an ionic contaminate, although
not always.  The temperature activation energy for aluminum is 0.9 eV
independent of humidity.  For copper, I haven't found anything specific.
Maybe someone else has.  But, metalization in general lists 0.3 to 0.9 eV.

Hope this helps.  Maybe one of the experts on the forum will have a better
answer.

Glenn

Sources:  D.S. Peck, O.D. Trapp, O. Hallberg, J.N. Thielman


Wanner Bernhard <[log in to unmask]> Wrote:
|
|         Hi Techies, 2 short questions:
|         Do anybody know the elasticity modulus of Dow Corning 160 at -25oc
| and -40oC?
|         Do anybody know "the" activation energy (in eV) of the
| electromigration effect?
|
|         thanks
|         Bernhard

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