TECHNET Archives

August 1999

TechNet@IPC.ORG

Options: Use Monospaced Font
Show Text Part by Default
Show All Mail Headers

Message: [<< First] [< Prev] [Next >] [Last >>]
Topic: [<< First] [< Prev] [Next >] [Last >>]
Author: [<< First] [< Prev] [Next >] [Last >>]

Print Reply
Subject:
From:
"Edward Hare, <SEM Lab, Inc.>" <[log in to unmask]>
Reply To:
Date:
Fri, 20 Aug 1999 07:15:59 -0700
Content-Type:
text/plain
Parts/Attachments:
text/plain (34 lines)
Hi all,

I would like to hear from anyone who can estimate their manufacturing
yield impact due to failure of chip capacitors, i.e. due to cracks,
leakage, etc.  I have been doing failure analysis on these types of part
issues and I am trying to benchmark expected yield and/or failure rates
under "normal" conditions.

Any help would be sincerely appreciated!

Best Regards,
Ed Hare
--

               SEM Lab, Inc.
Scanning Electron Microscopy and Failure Analysis
               Snohomish, WA
               (425)335-4400
           http://www.sem-lab.com

##############################################################
TechNet Mail List provided as a free service by IPC using LISTSERV 1.8c
##############################################################
To subscribe/unsubscribe, send a message to [log in to unmask] with following text in
the body:
To subscribe:   SUBSCRIBE TECHNET <your full name>
To unsubscribe:   SIGNOFF TECHNET
##############################################################
Please visit IPC web site (http://www.ipc.org/html/forum.htm) for additional
information.
If you need assistance - contact Gayatri Sardeshpande at [log in to unmask] or
847-509-9700 ext.5365
##############################################################

ATOM RSS1 RSS2