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March 1999

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Subject:
Good Paper: metallic electromigration
From:
"Hogue, Pat (AZ76)" <[log in to unmask]>
Reply To:
TechNet E-Mail Forum.
Date:
Fri, 26 Mar 1999 15:49:51 -0700
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With all of the recent discussion on silver migration I thought it might be
helpful to mention a good review paper on the subject of metallic
electromigration (in general) and silver electromigration (in particular):

Krumbein, Simeon D. Tutorial: Electrolytic Models for Metallic
Electromigration Failure Mechanisms, IEEE Trans. on Reliability, vol. 44,
no. 4, 1995 December.

Happy reading.

Pat Hogue
Materials and Processes Engineering
Honeywell Satellite Systems Operation
Glendale, AZ 85308
(602) 561-3748

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