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February 1999

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Subject:
From:
Brigitte Haugk <[log in to unmask]>
Reply To:
TechNet E-Mail Forum.
Date:
Tue, 9 Feb 1999 14:22:20 -0600
Content-Type:
text/plain
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A better and more repeatable method of measuring ionic contamination is by
ion chromatography. It not only gives  total ionic contamination, but also
ion specific contamination which can help in troubleshooting a contamination
problem.
Using an Omegameter, each model extracts different amounts of contamination.
Readings therefore are reference numbers only, not a true measure of the
actual contamination.

-----Original Message-----
From: TechNet [mailto:[log in to unmask]]On Behalf Of
[log in to unmask]
Sent: Monday, February 08, 1999 7:52 PM
To: [log in to unmask]
Subject: [TN] solder paste residues


I am trying to quantify the residues left over after reflow from no clean
solder
paste.  We have an omega meter in the facility that gives you an ionic
measurement (resistivity and NaCl/inch).  Is this an adquate measurement?

I am qualifying new pastes, and there is a concern in the ICT area about
residues.  Are there any other alternative methods of quantifying solder
paste
flux residues?

-Teo Tijerina

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