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January 1999

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Subject:
From:
Craig Patterson <[log in to unmask]>
Reply To:
TechNet E-Mail Forum.
Date:
Tue, 12 Jan 1999 10:45:00 -0500
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As part of our stress screening for the electronic equipment that we build (consisting of standard SMD ICs, resistors, capacitors and a couple of Vacuum Florescent Displays) we burn-in the units at 104 Deg F. for 9 hours then power cycle the units (still at 104) for 6 hours, 4 minutes on, 4 minutes off. 

I would be interested in any comments from the other Quality Professionals in the group as to the sensibility of this test screen. Are we wasting our time at these temperatures or would power cycling alone screen as much as does the soak and cycle at 104 Deg. F.

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