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December 1998

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Subject:
From:
John Mastorides <[log in to unmask]>
Reply To:
TechNet E-Mail Forum.
Date:
Tue, 22 Dec 1998 11:26:10 -0500
Content-Type:
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text/plain (31 lines)
J-STD-001B Cleaning Options:

Paragraph 8.3.2 has a default cleanliness designator of C-22 which is
cleaning both sides of the assembly (the first 2) and performing tests for
Ionic residues per 8.3.6 and/or 8.3.7 (the second 2).

In addition, paragraph 8.3.5 Flux Residues states "Assemblies shall be
tested in accordance with IPC-TM-650, Test Method 2.3.7 and shall comply
with the following requirements..."

Does this mean that on a Class 3 program, with a designator of C-22 (which
does not require test method 2.3.7), that test method 2.3.7 must still be
performed based on the "shall" requirement of 8.3.5, OR that 8.3.5 does not
apply because it is not part of the C-22 designator?

Thanks in advance.

John Mastorides

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