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September 1998

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Subject:
From:
Cory and Lise Steeby <[log in to unmask]>
Reply To:
TechNet E-Mail Forum.
Date:
Mon, 21 Sep 1998 05:43:26 -0500
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Will anyone point me to studies on Burn In.  We are maufacturing a product
with desired high relibility and need to determine if the screening
provided by burn in will be beneficial.  If burn in is performed the next
questions are how many and how long.  Our opinion is that semiconductive
devices are manufactured to such high relibility that our additional
screening will provide little if any benefit.

Thank you in advace.

Cory Steeby
EBW Electronics
Holland MI

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