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August 1998

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Subject:
From:
"Timothy A. Estes" <[log in to unmask]>
Reply To:
TechNet E-Mail Forum." <[log in to unmask]>, "Timothy A. Estes" <[log in to unmask]>
Date:
Fri, 21 Aug 1998 11:11:22 -0600
Content-Type:
text/plain
Parts/Attachments:
text/plain (88 lines)
Hi Marcelo,

We offer a testing and analysis service that provides process capability
data on PCB manufacturing capabilities.  When performing reliability studies
it is very important to know whether the manufacturing process that produced
the PCB is controlled.  Reliability studies performed on PCBs from processes
that are not controlled can lead to erroneous conclusions.

We have the capability to measure precision resistance down to a few
mili-ohms on conductors and via daisy-chains.  We do not perform insitu
tests but can perform tests on specialized patterns before and after
environmental stress, and report failures and resistance differences.

Please feel free to contact me if you have any questions.

Tim Estes
Conductor Analysis Technologies, Inc.



>  From:        "Chan, Marcelo" <[log in to unmask]>, on 8/20/98 3:08 PM:
>  I would like to know if it is possible these days to conduct reliability
>  tests
>  on daisy chain components and monitor < 2 Ohms resistance change rather
than
>  just continuity... I understand that I could utilize the four probe
>  resistance
>  approach, but I would like to monitor about 100 devices
simultaneously...I
>  am
>  looking manageable approaches for upgrading our current continuity
>  approach....
>  Also, how do people overcome the data logging of intermittent failures
>  without
>  causing a tremendous amount of data.... on one hand, we want to capture
an
>  open
>  during temperature cycling, but not log the same device over and over
again
>  in a
>  span of 1 second....
>
>  Thanks,
>
>  Marcelo
>
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