We have performed the type of test you describe.  Please feel free to contact me if we can be of service.
As you suggest, you do get a large number of data points.  In past programs we've wound up with
approximately one reading per second per channel.  The computer can automatically flag predefined alarms.
We then import all the data into a spreadsheet, identify maximum and minimum resistances and graph the
data.

Chan, Marcelo wrote:

> I would like to know if it is possible these days to conduct reliability tests
> on daisy chain components and monitor < 2 Ohms resistance change rather than
> just continuity... I understand that I could utilize the four probe resistance
> approach, but I would like to monitor about 100 devices simultaneously...I am
> looking manageable approaches for upgrading our current continuity approach....
> Also, how do people overcome the data logging of intermittent failures without
> causing a tremendous amount of data.... on one hand, we want to capture an open
> during temperature cycling, but not log the same device over and over again in a
> span of 1 second....
>
> Thanks,
>
> Marcelo
>
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John Moylan
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Delsen Testing Laboratories, Inc.
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Delsen Testing Laboratories, Inc. is an independent testing
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