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Subject:	Developments in reliability testing
From:	"Chan, Marcelo" <[log in to unmask]>
Reply To:	TechNet E-Mail Forum." <[log in to unmask]>, "Chan, Marcelo" <[log in to unmask]>
Date:	Thu, 20 Aug 1998 15:08:14 -0400
Content-Type:	text/plain
Parts/Attachments:	text/plain (37 lines)

I would like to know if it is possible these days to conduct reliability tests
on daisy chain components and monitor < 2 Ohms resistance change rather than
just continuity... I understand that I could utilize the four probe resistance
approach, but I would like to monitor about 100 devices simultaneously...I am
looking manageable approaches for upgrading our current continuity approach....
Also, how do people overcome the data logging of intermittent failures without
causing a tremendous amount of data.... on one hand, we want to capture an open
during temperature cycling, but not log the same device over and over again in a
span of 1 second....

Thanks,

Marcelo

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