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Reply To: | TechNet E-Mail Forum. |
Date: | Thu, 20 Aug 1998 13:19:11 -0600 |
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Equipment should be available from Keithley, National and such to log
resistance changes at numerous nodes at programmed intervals and to stop
logging the values for a node when above set limit.
-----Original Message-----
From: Chan, Marcelo [SMTP:[log in to unmask]]
Sent: Thursday, August 20, 1998 1:08 PM
To: [log in to unmask]
Subject: [TN] Developments in reliability testing
I would like to know if it is possible these days to conduct
reliability tests
on daisy chain components and monitor < 2 Ohms resistance change
rather than
just continuity... I understand that I could utilize the four probe
resistance
approach, but I would like to monitor about 100 devices
simultaneously...I am
looking manageable approaches for upgrading our current continuity
approach....
Also, how do people overcome the data logging of intermittent
failures without
causing a tremendous amount of data.... on one hand, we want to
capture an open
during temperature cycling, but not log the same device over and
over again in a
span of 1 second....
Thanks,
Marcelo
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