Could this study also address evaluation of ionic levels on boards
going through no-clean assembly processing ?

Review of methods for local ion chromatography analysis of critical
board areas for process/product qualification would be helpful.

Thank you.

Karl Sauter
Sun Microsystems
(408) 276-5499


> Date: Tue, 7 Apr 1998 09:16:22 -0400
> From: Allan Kerr <[log in to unmask]>
> Subject: Re: [TN] Invitation to Participate in Cleanliness Assessment Study
          -Reply
> To: [log in to unmask]
>
> I don't agree, we need a standard PROACTIVE method of detection.  I
> don't think that anyone is suggesting that the industry tool up ion
> chromatography but, it is the superior tool to baseline the process.  The
> industry is having real world problems due to this issue.  We need this
> study completed so that the board fab world and the end users have a
> document that is relevant, standard ROSE is not.
>
> >>> Robisan1 <[log in to unmask]> 04/06/98 01:45pm >>>
> Jon
> Right!  So if you fail SIR, it would be appropriate
> to perform ion chromatography to determine which
> material was the cause for failure.
>
> But to do ion chromatography up front seems like
> overkill and costly when you might not need it at all.
>
> Susan Mansilla
>
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