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March 1998

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Subject:
From:
Robisan1 <[log in to unmask]>
Reply To:
TechNet E-Mail Forum.
Date:
Tue, 31 Mar 1998 09:56:24 EST
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Anna
This is partially my opinion and partially common sense.
The specs limit the magnification for detecting defects
because at higher magnifications defects may be called
out which are not there.  The 100X with a 200X referee has
been both industry and military standard for many years
now.

However when it comes to measuring, you should not get
a different value no matter what magnification you use. If
with your microscope set up it is easier to measure at 200X
then that is what I would do.  For example when I measure
internal annular rings on a qualification, I use 50X because
the entire distance would not be in my field of vision at 100X
and to move stuff around is a real pain.

Susan Mansilla
Technical Director
Robisan Laboratory

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