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December 1997

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Subject:
From:
Jeff Mallia <[log in to unmask]>
Reply To:
TechNet Mail Forum.
Date:
Thu, 18 Dec 1997 16:13:05 +1100
Content-Type:
text/plain
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Hello Technet,

I am working with a small team introducing an SMT production line.

Currently I am designing a test vehicle for the accelerated reliability
thermocycling for our first process validation.


I have read the SM-785 "Guidelines for Accelerated testing..." and would
like to know if anyone can clarify in the Appendix A, step by step
example, why 32 groups of 8 series capacitors were used instead of just
32 individually monitored capacitors?

Thanks

Jeff

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