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November 1997

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Subject:
Electronic Field Failures Caused by Temperature
From:
Matt Aubrey <[log in to unmask]>
Reply To:
TechNet Mail Forum.
Date:
Thu, 6 Nov 1997 18:28:10 -0500
Content-Type:
text/plain
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text/plain (21 lines) 
I am looking for information breaking down commercial electronic
field failures by mechanism.  I have seen data like this for avionics.

Can you suggest any references for other types of electronic products.

Thank you.

Matt Aubrey

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