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November 1997

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TechNet <[log in to unmask]>
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Date:
Sat, 8 Nov 1997 11:37:49 -0800
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Subject:
Re: Electronic Field Failures Caused by Temperature
From:
Pratap Singh <[log in to unmask]>
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RAMP Inc
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Matt:

You may like to read - "Failure Modes and Mechanisms in Electronics
Packages" recently published by Chapman & Hall. Their web site is
http://www.chaphall.com OR write to:

International Thomson Publishing
7625 Empire Drive,
Florence, KY 41042
Tel: (606) 525-6600 or 1 800-842-3636

ISBN 0-412-10591-8

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