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August 1997

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Subject:
From:
Ferrell-2 Bobby <[log in to unmask]>
Reply To:
TechNet Mail Forum.
Date:
Mon, 4 Aug 1997 08:31:33 -0400
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Has anyone out there done any in-depth analysis of Positive etchback
versus de-smear processing before the plating of thru holes, in
particular with respect to reliability in a shock and vib environment.

Any comments or info would be greatly appreciated.

Thanks in advance

        Bob Ferrell
        NASA
        DL-HDD
        KSC, FL 32899
        e-mail:  [log in to unmask]
>


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