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August 1997

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TechNet Mail Forum<[log in to unmask]>
Subject:
Failure Analysis, RF power FETs
From:
Sheila Smith <[log in to unmask]>
Date:
Mon, 4 Aug 1997 16:11:41 -0400
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"TechNet Mail Forum." <[log in to unmask]>, Sheila Smith <[log in to unmask]>
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TechNetters,

Can anyone suggest a lab or consulting organization to take a look at some
power FETs that failed in reliability testing?  We are trying to determine
failure mode.  We think devices were running "well" above recomended
junction temps when they failed and may have had contamination of the die
surface.  Any help would be appreciated!

Sheila Smith, Tracor AES

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