TECHNET Archives

August 1997

TechNet@IPC.ORG

Options: Use Monospaced Font
Show Text Part by Default
Condense Mail Headers

Message: [<< First] [< Prev] [Next >] [Last >>]
Topic: [<< First] [< Prev] [Next >] [Last >>]
Author: [<< First] [< Prev] [Next >] [Last >>]

Print Reply
Sender:
TechNet Mail Forum<[log in to unmask]>
Subject:
From:
"Nachbor, Suzanne (MN51)" <[log in to unmask]>
Date:
Mon, 4 Aug 1997 14:25:00 PDT
Reply-To:
"TechNet Mail Forum." <[log in to unmask]>, "Nachbor, Suzanne (MN51)" <[log in to unmask]>
Parts/Attachments:
text/plain (11 lines)
We've seen some similar "long term failures".  We were able to do failure
analysis on the boards and found ionic contaminants on the innerlayer that
were very high in the arc'ed region.  We looked for CFF but have not
conclusively observed this phenomenon.  Unfortunately, all the parts that we
looked at had already arc'ed so if there was CFF it was blown away.

Suzanne Nachbor
Honeywell
6129573923


ATOM RSS1 RSS2