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April 1997

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Subject:
"Pogo Pin test probes
From:
Steve Tetorka <[log in to unmask]>
Date:
Thu, 17 Apr 1997 11:02:00 -0800
Content-Type:
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It appears that "pogo pins" used in "bed-of-nails" test fixtures may
cause
signal problems at 'high frequencies'.  This problem is due to the
length of
the probes.
This same problem had occured with IC test sockets.  Your comments are
welcome.
Thank you.

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