Jonathan,

I'm not sure what type of AOI system you are using but a 1-3 mil accuracy pre-requisite to find the image for inspection seem awful tight. I think most of us pin to the same punched slots as you are for our AOI. Many AOI systems have a variable ( programmable)  tolerance threshold to find the intended image/area to be inspected. Many board manufacturers have added fiducials to the panels for locating and inspecting the image. This are a couple of things to look at. I really think your problem is in the limits of the AOI equipment and not necessarily your tooling.

Ed Cosper
  
----------
From:  Jonathan Whitcomb[SMTP:[log in to unmask]]
Sent:  Wednesday, February 19, 1997 4:12 PM
To:  [log in to unmask]
Subject:  FAB: innerlayer core locating slot integrity

    We're experiencing problems with location slot damage coming from AOI
(optical test) and defect verification of innerlayer cores.  Our test systems
need to locate accurately (within 1-3 mils) to do the test, and are currently
locating using pins in the same centerline slots we use for subsequent
lamination into composites.  We'd like to move test to an auxiliary set of
slots somewhere else on the panel that would be punched in at the same time
as the regular slots, but are facing significant retooling costs across two
punches and a multiplicity of testers.
    What do other folks do?  Is there an easier way?

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