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February 1997

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Fri, 14 Feb 1997 15:09:12 -0600
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Charles Barker
02/14/97 03:09 PM

We are investigating switching from RMA and SA based fluxes to WS fluxes.
We notice much higher and inconsistent Ohmegameter readings with the WS
fluxes. Is there a better means of measuring Ionic contaminants when using
WS flux? What are others using to check how "clean" a WS processed assembly
is after wash?

Thanks in advance.

Charlie Barker


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