The following is a summary of the General Dynamics Defense Systems
Test and Analysis Labs, which includes SEM test and analysis
facilities. For more information or to set up a meeting to discuss
your test and analysis needs please contact:
Michael J. Morris
General Dynamics Defense Systems
100 Plastics Ave., Room 2228
Pittsfield, MA 01201
Phone: (413) 494-5914
email: [log in to unmask]
------------------------------------------------------------------
The General Dynamics Defense Systems Test and Analysis Labs consist of
four fully equipped and staffed facilities: Materials & Processes
Lab, Component Test & Analysis Center, Scanning Electron Microscope
Lab, and Environmental Lab.
OUR MISSION:
Provide expertise and management/implement test and analysis
capabilities for customers in the areas of materials, processes, and
electronics. Perform cost effective, timely and high quality analyses
that result in the selection of the best products/processes and the
most effective resolution of issues.
SCOPE:
Analysis to fit the needs throughout product life cycle: from design,
through production and during customer use.
Types of analysis include: manufacturing process evaluation,
metallurgical, chemical, electromechanical & electronic parts
assessment, failure analysis ... and more.
CAPABILITIES:
Electrical: parametric testing, burn-in, life test, ESD
Mechanical: vibration, thermal shock and cycling, mechanical shock,
tensile strength, seal integrity, bond strength, die shear,
acceleration (centrifuge)
Chemical/Materials: material identification, wet and spectrometric
chemical analysis, contamination appraisal, humidity, salt spray,
resistance to solvents, life test, particle impact noise detection
(PIND), atmospheric corrosivity, material compatibility, outgassing,
trace metals analysis, and ion chromatography
Physical: photometry, colorimetry, dimensional, photographs, visual
inspection to 2000x, SEM microscopy to 70,000x, infrared thermography,
microthermography, and plating thickness
Metallurgical: cross sectioning, grain size, microstructure,
fractography, hardness and microhardness, and surface morphology
EQUIPMENT & FACILITIES:
JEOL Scanning Electron Microscope
Microanalysis System with EDS, WDS
Agema Infrared Thermal Imager
Dionex Ion Chromatograph
Thermal Evaluation Equipment - TGA / TMA / DSC
Perkin Elmer Inductively Coupled Plasma - Mass Spectrometer Titration
and Wet Chemistry Facilities
Environmental Chambers
Electronic Benchtop Equipment
Automated Electronic N/C Test Equipment Pritchard Photometer
Avco Mechanical Shock Machines
Ling/Kimball Electromagnetic Vibration System Tensile and Compression
Testers
X-ray Fluorescence
Optical Microscopes, Microhardness Tester, Liquid Crystal
Microthermography System & more
***************************************************************************
* TechNet mail list is provided as a service by IPC using SmartList v3.05 *
***************************************************************************
* To unsubscribe from this list at any time, send a message to: *
* [log in to unmask] with <subject: unsubscribe> and no text. *
***************************************************************************
* If you are having a problem with the IPC TechNet forum please contact *
* Dmitriy Sklyar at 847-509-9700 ext. 311 or email at [log in to unmask] *
***************************************************************************
|
