From:  Stephen Ayotte
\\\\\\\EM Quality Engineering
\\\\\\\Bldg. 14-3 Col F5 5-1537
Subject:
There are a number of good articles on CAF that I have seen.

Given the amount of discussion lately on the military failure
and CAF I thought these might be beneficial.

Circuit World Vol 21 No. 4 1995 pgs. 1-9
  "Microstructure of Conductive Anodic Filaments Formed during
   Accelerated Testing of Printed Wiring Boards" authors -
   Ready, Stock, Freeman, Dollar and Turbini

and its associated references.

**** IBM MD Product Quality Engineer****
****         OEM Quality Engineer   ****