Received: |
by ipc.org (Smail3.1.28.1 #2)
id m0uDz27-00007YC; Mon, 29 Apr 96 14:54 CDT |
Encoding: |
31 Text |
Old-Return-Path: |
|
Date: |
Mon, 29 Apr 96 15:56:39 CST |
Precedence: |
list |
Resent-From: |
|
Resent-Sender: |
|
From [log in to unmask] Wed May 1 14: |
33:27 1996 |
Status: |
O |
X-Mailing-List: |
|
TO: |
|
Return-Path: |
<TechNet-request> |
Resent-Message-ID: |
<"kNq6b.0.Eu8.FwHXn"@ipc> |
Subject: |
|
From: |
|
X-Status: |
|
X-Loop: |
|
Message-Id: |
|
Parts/Attachments: |
|
|
What is the mfr and pn?
What's the environment:
high particulate?
cable flexing?
air flow/no air flow?
drastic temp swings?
______________________________ Reply Separator _________________________________
Subject: DES> Connector Reliability
Author: [log in to unmask] at internet-mail
Date: 4/29/96 12:37 PM
We have a header in a prototype system with brass sprung contacts with gold
plate over nickel, contacting pins which are also gold-plate over nickel.
This connector carries 3A, and is showing a strong tendency to increase in
contact resistance in field tests (up to 150 mOhm). Removing and refitting
the connector takes the contact resistance back to "as new" (<40 m Ohm).. The
connectors have been examined by a test lab and pronounced OK, with no
contamination. No deposit or oxidation is visible on the surface.
Has anyone seen similar failure mechanism? What's the physics?
Terry Davey -------------------------------- [log in to unmask] ------
|
|
|