TECHNET Archives

1995

TechNet@IPC.ORG

Options: Use Monospaced Font
Show Text Part by Default
Show All Mail Headers

Message: [<< First] [< Prev] [Next >] [Last >>]
Topic: [<< First] [< Prev] [Next >] [Last >>]
Author: [<< First] [< Prev] [Next >] [Last >>]

Print Reply
Subject:
From:
Date:
Wed, 30 Aug 1995 16:28:41 -0500
Content-Type:
text/plain
Parts/Attachments:
text/plain (11 lines)
     
     Does anyone have any recommendations for labs that will perform 
     failure analysis for potential EOS/ESD damage to components ?
     
     Darrell Drake
     Sr. Process Engineer
     (713) 987-4365
     DRAKE@SSDSRDCC



ATOM RSS1 RSS2