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Date: | Fri, 27 Apr 2018 14:46:23 +0000 |
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Hi all,
In 2014, I replaced my SiLi EDS detector with an SSD detector with an ultra-thin polymer window.
My detector failed and the manufacturer says it was due to loss of vacuum and named the probable source as micro-tears in the window Large tears or holes were not visible.
Has anyone experienced this?
If so, did you find a cause for the micro-tears?
Did you come up with a corrective action to avoid damaging it again?
Thank you.
Best Regards,
Andy
Andrew C. Giamis
Senior Failure Analysis Engineer
CommScope
2601 Telecom Pkwy
Richardson, TX, 75082, USA
phone: 972-952-9847
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