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February 2017

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Subject:
Re: XRF analysis
From:
Bhanu Sood <[log in to unmask]>
Reply To:
TechNet E-Mail Forum <[log in to unmask]>, Bhanu Sood <[log in to unmask]>
Date:
Tue, 7 Feb 2017 10:06:38 -0500
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Yes, for bulk analyzes which detect the "presence" and % of Pd.
For layer thickness, identify its sequence in the stack-up when you create
the defMA.

On Tue, Feb 7, 2017 at 9:14 AM, <[log in to unmask]> wrote:

> Fellow TekNetters:
>
>    Can Palladium, Pd, be identified in an alloy mixture such as Ni/Pd with
> a Fischer scope XRF Instrument?   I have detected Pd as a layer by itself
> in the past.
>
> Victor,
>



-- 
Bhanu Sood
Tel: (202) 468-8449

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