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October 2016

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Subject:
From:
Jose A Rios <[log in to unmask]>
Reply To:
TechNet E-Mail Forum <[log in to unmask]>, Jose A Rios <[log in to unmask]>
Date:
Tue, 18 Oct 2016 13:44:11 +0000
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XRF is widely accepted, and preferred over assessments by x-sections.

Sent from my iPhone

> On Oct 18, 2016, at 9:29 AM, Bob Wettermann <[log in to unmask]> wrote:
> 
> Outside of x-sectional measurements for QA. can someone please share their
> favorite method/instrument for measuring gold thicknesses on PCBs?
> 
> Thanks
> 
> Bob/BEST

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