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Subject:	Re: J-STD-001 Space Addendum
From:	"Stadem, Richard D." <[log in to unmask]>
Reply To:	TechNet E-Mail Forum <[log in to unmask]>, Stadem, Richard D.
Date:	Tue, 20 Sep 2016 13:19:56 +0000
Content-Type:	text/plain
Parts/Attachments:	text/plain (19 lines)

Agreed. The cost is neglible.

-----Original Message-----
From: TechNet [mailto:[log in to unmask]] On Behalf Of John Burke
Sent: Monday, September 19, 2016 7:00 PM
To: [log in to unmask]
Subject: Re: [TN] J-STD-001 Space Addendum

Xray every one of them.

Best regards,

John Burke
 

> On Sep 19, 2016, at 2:52 PM, Joey Rios <[log in to unmask]> wrote:
> 
> Sections 7.5.14, 15 and 16 outlines inspection of hidden solder joints, invoking the use of X-Ray in the Space Addendum. The standard does not explicitly prescribe a sampling extent, so, if an assembly has dozens of the same device, like 50-100 say of such devices (such as a bottom termination component) on a single PWA, is the expectation (J-STD intent) that each of the replicate devices are inspected by X-Ray?? Is that what the industry practices, or is sampling commonly invoked, since the processing of the board is the same for the entire PWA??

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