Gee,.. I wish I had said that.
Most succinct.
Rich Kraszewski
From: Douglas Pauls [mailto:[log in to unmask]]
Sent: Tuesday, August 02, 2016 2:06 PM
To: Richard Kraszewski; TechNet E-Mail Forum
Subject: Re: [TN] FTIR
To add to what Rich said, FTIR is primarily a qualitative tool. While quantitative analysis is possible, it is much more difficult to do. You need to be a Bev Christian class chemist to do it right.
On Aug 2, 2016 8:18 AM, "Richard Kraszewski" <[log in to unmask]<mailto:[log in to unmask]>> wrote:
If that method or similar gets reissued I hope it clearly states there are no pass fail criteria for the test method. There have been numerous occasions where I have needed to challenge a failure analysis because they show me WOA signatures on a extract from a well cleaned PCA. Current FTIR instrumentation & software is pretty powerful, allows you to massage a reasonable result from even a trace quantity.
Rich Kraszewski /Plexus
-----Original Message-----
From: TechNet [mailto:[log in to unmask]<mailto:[log in to unmask]>] On Behalf Of Douglas Pauls
Sent: Tuesday, August 02, 2016 7:24 AM
To: [log in to unmask]<mailto:[log in to unmask]>
Subject: Re: [TN] FTIR
ASTM also has a number of FTIR test methods that are fairly up to date, but I have not reviewed them to see if they are suitable for electronic assemblies. I would imagine the American Chemical Society may be another place to look.
The IPC FTIR method was cancelled because it was based on high solids rosin fluxes, seldom used today, and the originating task group, of which I think I am the last one standing, was disbanded years ago, so there has not been a group to work on updating that method.
Doug Pauls
Principal Materials and Process Engineer Rockwell Collins
On Tue, Aug 2, 2016 at 5:32 AM, Gerald Bogert (Contractor) < [log in to unmask]<mailto:[log in to unmask]>> wrote:
> August 2, 2016
>
> The SAE has developed a new standard for using FTIR for counterfeit
> electronic part detection. It is AS6171/9 of SAE AS6171., have passed
> ballot and have been sent to SAE Content Management for formatting,
> prior to being submitted to Aerospace Council for final approval, and
> hopefully the documents will be released later this year. Once the
> documents are published, SAE intent is to publish SAE AS6081 revision
> A which will default to the inspection and test requirements of AS6171
> with appropriate slash sheets. AS6081 applies to open market EEE part
> distributors (e.g., independent distributors, brokers).
>
> On Mon, Aug 1, 2016 at 3:41 PM, Bev Christian
> <[log in to unmask]<mailto:[log in to unmask]>>
> wrote:
>
> > All, I should elaborate and say that the method is about using
> > infra-red spectroscopy for material identification, usually organic materials.
> FTITR
> > is just a method of collecting and "averaging" many spectra to get
> > much, much better signal to noise ratios.
> > Regards,
> > Bev
> >
> > -----Original Message-----
> > From: TechNet [mailto:[log in to unmask]<mailto:[log in to unmask]>] On Behalf Of Bev Christian
> > Sent: Monday, August 01, 2016 12:08 PM
> > To: [log in to unmask]<mailto:[log in to unmask]>
> > Subject: Re: [TN] FTIR
> >
> > Graham
> > 2.3.39C CANCELLED. This is the only one that I am familiar with.
> > What
> is
> > your problem/issue you are trying to solve?
> > Regards,
> > Bev
> >
> > -----Original Message-----
> > From: TechNet [mailto:[log in to unmask]<mailto:[log in to unmask]>] On Behalf Of Graham Naisbitt
> > Sent: Monday, August 01, 2016 11:57 AM
> > To: [log in to unmask]<mailto:[log in to unmask]>
> > Subject: [TN] FTIR
> >
> > Hello fellow Techies,
> >
> > Do any of you know if there is a test method in IPC for FTIR?
> >
> > Thanks in advance
> >
> > Graham Naisbitt
> >
>
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