To add to what Rich said, FTIR is primarily a qualitative tool.  While
quantitative analysis is possible, it is much more  difficult to do. You
need to be a Bev Christian class chemist to do it right.

On Aug 2, 2016 8:18 AM, "Richard Kraszewski" <[log in to unmask]>
wrote:

> If that method  or similar  gets  reissued I hope it clearly states there
> are  no pass fail criteria for the test method.   There  have  been
> numerous occasions where I have needed to  challenge a failure analysis
> because they show me  WOA signatures on a extract  from a well cleaned
> PCA.  Current FTIR instrumentation & software is pretty powerful, allows
> you to massage a reasonable result from even a  trace quantity.
>
> Rich  Kraszewski /Plexus
>
>
> -----Original Message-----
> From: TechNet [mailto:[log in to unmask]] On Behalf Of Douglas Pauls
> Sent: Tuesday, August 02, 2016 7:24 AM
> To: [log in to unmask]
> Subject: Re: [TN] FTIR
>
> ASTM also has a number of FTIR test methods that are fairly up to date,
> but I have not reviewed them to see if they are suitable for electronic
> assemblies. I would imagine the American Chemical Society may be another
> place to look.
>
> The IPC FTIR method was cancelled because it was based on high solids
> rosin fluxes, seldom used today, and the originating task group, of which I
> think I am the last one standing, was disbanded years ago, so there has not
> been a group to work on updating that method.
>
>
> Doug Pauls
> Principal Materials and Process Engineer Rockwell Collins
>
> On Tue, Aug 2, 2016 at 5:32 AM, Gerald Bogert (Contractor) <
> [log in to unmask]> wrote:
>
> > August 2, 2016
> >
> > The SAE has developed a new standard for using FTIR for counterfeit
> > electronic part detection.  It is AS6171/9 of SAE AS6171., have passed
> > ballot and have been sent to SAE Content Management for formatting,
> > prior to being submitted to Aerospace Council for final approval, and
> > hopefully the documents will be released later this year.  Once the
> > documents are published, SAE intent is to publish SAE AS6081 revision
> > A which will default to the inspection and test requirements of AS6171
> > with appropriate slash sheets.  AS6081 applies to open market EEE part
> > distributors (e.g., independent distributors, brokers).
> >
> > On Mon, Aug 1, 2016 at 3:41 PM, Bev Christian
> > <[log in to unmask]>
> > wrote:
> >
> > > All, I should elaborate and say that the method is about using
> > > infra-red spectroscopy for material identification, usually organic
> materials.
> > FTITR
> > > is just a method of collecting and "averaging" many spectra to get
> > > much, much better signal to noise ratios.
> > > Regards,
> > > Bev
> > >
> > > -----Original Message-----
> > > From: TechNet [mailto:[log in to unmask]] On Behalf Of Bev Christian
> > > Sent: Monday, August 01, 2016 12:08 PM
> > > To: [log in to unmask]
> > > Subject: Re: [TN] FTIR
> > >
> > > Graham
> > > 2.3.39C CANCELLED.  This is the only one that I am familiar with.
> > > What
> > is
> > > your problem/issue you are trying to solve?
> > > Regards,
> > > Bev
> > >
> > > -----Original Message-----
> > > From: TechNet [mailto:[log in to unmask]] On Behalf Of Graham Naisbitt
> > > Sent: Monday, August 01, 2016 11:57 AM
> > > To: [log in to unmask]
> > > Subject: [TN] FTIR
> > >
> > > Hello fellow Techies,
> > >
> > > Do any of you know if there is a test method in IPC for FTIR?
> > >
> > > Thanks in advance
> > >
> > > Graham Naisbitt
> > >
> >
>