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May 2015

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Subject:
From:
"Nieznanski, John A - Exelis" <[log in to unmask]>
Reply To:
TechNet E-Mail Forum <[log in to unmask]>, Nieznanski, John A - Exelis
Date:
Mon, 11 May 2015 22:38:58 +0000
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Hello Tech-Net!

I was just starting a literature search on the topic of Accelerated Life Testing for CMOS ESD diodes. Has anyone seen any results from this type of testing, either successful or unsuccessful? I'd like to start by getting a good handle on the relevant failure modes.

Thanks!

John Nieznanski

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