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Victor,
Pictures depend very much on the conditions and device exposed. The obvious
are the high power MOSETS when they 'blow' it is pretty much self-evident
where the damage is. The more insidious are the input amps, etc. that take
a great deal of SEM work and failure analysis to find the fault.
I believe that ESD can create/cause EOS......Maybe I had better check the
definitions in Karen's post before going further...
Steve Creswick
Sr Associate - Balanced Enterprise Solutions
http://www.linkedin.com/in/stevencreswick
616 834 1883
-----Original Message-----
From: TechNet [mailto:[log in to unmask]] On Behalf Of Victor Hernandez
Sent: Thursday, May 29, 2014 8:38 AM
To: [log in to unmask]
Subject: [TN] Electrical Over Stress
Importance: High
Fellow TechNetters:
Searching for a good description/definition for Electrical Over Stress,
EOS, and what would be expected of the device metallization to look like.
Can ESD be considered EOS.
Victor,
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