Victor,

Pictures depend very much on the conditions and device exposed.  The obvious
are the high power MOSETS when they 'blow' it is pretty much self-evident
where the damage is.  The more insidious are the input amps, etc. that take
a great deal of SEM work and failure analysis to find the fault.

I believe that ESD can create/cause EOS......Maybe I had better check the
definitions in Karen's post before going further...


Steve Creswick
Sr Associate - Balanced Enterprise Solutions
http://www.linkedin.com/in/stevencreswick
                         616 834 1883



-----Original Message-----
From: TechNet [mailto:[log in to unmask]] On Behalf Of Victor Hernandez
Sent: Thursday, May 29, 2014 8:38 AM
To: [log in to unmask]
Subject: [TN] Electrical Over Stress
Importance: High

Fellow TechNetters:

   Searching for a good description/definition for Electrical Over Stress,
EOS, and what would be expected of the device metallization to look like.
Can ESD be considered EOS.

Victor,

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