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May 2014

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Subject:
From:
Karen Tellefsen <[log in to unmask]>
Reply To:
TechNet E-Mail Forum <[log in to unmask]>, Karen Tellefsen <[log in to unmask]>
Date:
Thu, 29 May 2014 08:44:03 -0400
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This should help

http://www.intel.com/content/dam/www/public/us/en/documents/guides/ch3-esd-eos-guide.pdf

Karen Tellefsen - Electrical Testing
Alpha / 109 Corporate Blvd./ S. Plainfield, NJ 07080
[log in to unmask]
908-791-3069




From:   Victor Hernandez <[log in to unmask]>
To:     <[log in to unmask]>, 
Date:   05/29/2014 08:38 AM
Subject:        [TN] Electrical  Over  Stress
Sent by:        TechNet <[log in to unmask]>



Fellow TechNetters:

   Searching for a good description/definition for Electrical Over Stress, 
EOS, and what would be expected of the device metallization to look like.  
Can ESD be considered EOS.

Victor,

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