TECHNET Archives

December 2013

TechNet@IPC.ORG

Options: Use Monospaced Font
Show Text Part by Default
Show All Mail Headers

Message: [<< First] [< Prev] [Next >] [Last >>]
Topic: [<< First] [< Prev] [Next >] [Last >>]
Author: [<< First] [< Prev] [Next >] [Last >>]

Print Reply
Subject:
From:
"Vladimir Igoshev. PhD" <[log in to unmask]>
Reply To:
TechNet E-Mail Forum <[log in to unmask]>, Vladimir Igoshev. PhD
Date:
Thu, 26 Dec 2013 13:18:21 -0500
Content-Type:
text/plain
Parts/Attachments:
text/plain (26 lines)
Well, in essence a solderability issue as it's about the ability of a
given QFN to be soldered and that ability will depend on the design,
the process etc. In many cases with various components a component
would easily pass the solderability test but fail to be soldered!

And it we won't call those defects 'voiding" then may be everyone will
realize that it's a different type of defect and won't rely on X-ray
trying to capture it.

-- 
Best regards,

Vladimir Igoshev. PhD                          mailto:[log in to unmask]

SENTEC Testing Laboratory Inc.
11 Canadian Road, Unit 7.
Scarborough, ON M1R 5G1
Tel: (416) 899-1882
Fax: (905) 882-8812
www.sentec.ca

______________________________________________________________________
This email has been scanned by the Symantec Email Security.cloud service.
For more information please contact helpdesk at x2960 or [log in to unmask] 
______________________________________________________________________

ATOM RSS1 RSS2