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June 2013

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Subject:
From:
Joyce Koo <[log in to unmask]>
Reply To:
TechNet E-Mail Forum <[log in to unmask]>, Joyce Koo <[log in to unmask]>
Date:
Fri, 7 Jun 2013 15:22:02 +0000
Content-Type:
text/plain
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text/plain (38 lines)
http://www.hipot.com/pdf/Safe-Testing.pdf


Joyce Koo
Researcher
Materials Interconnect Lab
Office: (519) 888-7465 79945
BlackBerry: (226) 220-4760

-----Original Message-----
From: TechNet [mailto:[log in to unmask]] On Behalf Of Michael Strong
Sent: Friday, June 07, 2013 11:17 AM
To: [log in to unmask]
Subject: [TN] Hipot Testing

Wondering if I can pick the brain of somebody out there.  When performing
Dielectric strength testing most of my failures are the result of a GFI.  I
can turn this feature off on my instrument and was wondering if most people
who do this testing do the same.  I know this is a safety feature but I'm
trying to find a more standardized way of doing this test.  What are the
likely consequences of turning this feature off?  Any advice would be
appreciated.



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