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May 2013

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Subject:
From:
Stewart McCracken <[log in to unmask]>
Reply To:
TechNet E-Mail Forum <[log in to unmask]>, Stewart McCracken <[log in to unmask]>
Date:
Thu, 9 May 2013 14:21:06 +0000
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Hi Rich,

Take a look at "Scanning Electron Microscopy and X-Ray Microanalysis" by Joseph Goldstein et al. 
Really good coverage on all topics. 

Kind regards,

Stewart 



Stewart McCracken

Managing Director | MCS | Solving your Materials, Manufacturing and Reliability Issues
[log in to unmask] | www.themcsgroup.co.uk | +44(0)131 440 9090 | +44(0)771 154 1735

-----Original Message-----
From: TechNet [mailto:[log in to unmask]] On Behalf Of Richard Kraszewski
Sent: 09 May 2013 14:24
To: [log in to unmask]
Subject: [TN] SEM Reference

Can anyone please recommend a good reference on SEM's?  

Hardware, techniques, best practices, etc. 

Thanks in advance 

Rich  Kraszewski
PLEXUS

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