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Subject:
From:
Douglas Pauls <[log in to unmask]>
Reply To:
TechNet E-Mail Forum <[log in to unmask]>, [log in to unmask]
Date:
Mon, 11 Mar 2013 07:00:21 -0500
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text/plain
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I like the three steps you list.  Gonna make use of it somewhere.

Doug Pauls



From:   Inge Hernefjord <[log in to unmask]>
To:     <[log in to unmask]>
Date:   03/09/2013 12:24 PM
Subject:        [TN] Dropbox
Sent by:        TechNet <[log in to unmask]>



Mornmidafternevning,

I added a report under Analysis methods.

One of many jobs where I used TOFSIMS (Time Of Flight Secondary Ion Mass
Spectrometry). A very useful way to determine the outmost superficial atom
layers. The reason why it is not used so often is the cost per hour. It is
not very complicated, even if the machine is a veritable monster. You
'simply' bombard the surface you want analyze with emitted ions via a
pulsed source. This ion beam knocks out ions from the very outermost 
single
atom layer of the target, therefore they are named 'secondary' ions. These
ions are accelerated (attraction) against a voltage biased plate, but they
must pass a tube first. The time it takes to 'fly' is dependent on the
ion's mass, and hence the time of flight tells you what element. You can
multiply the beam intensity and knock out so many ions that you create an
etching, repeat these steps and make measurements in between and ,alas, a
depth profile.

TOFSIMS consist of  three steps:

1. The skilled operator knows all about the machine, makes the routines 
and
leaves kilograms of paper or Megs of data to the guy who is often a 
pinhole
higher on the education steps.
2.He is often addressed  professor and he tailors the report in a suitable
academic costume to the customer, whereby the weight of the report seems 
to
be a matter of importance.
3The customer  has the nightmare job to understand what the learned man 
has
written. Not seldom, we pay a fortune for a exclusive and fat report, 
shake
our heads and do our own surveys.

However, if all three can cooperate all through the process, then it's a
very effective surface analysis instrument.

Inge


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