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November 2012

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From:
"David D. Hillman" <[log in to unmask]>
Reply To:
TechNet E-Mail Forum <[log in to unmask]>, [log in to unmask]
Date:
Wed, 7 Nov 2012 17:30:39 -0600
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Hi Wayne - that is a ridiculous volume of flux and I doubt that any 
specification requirement could prevent this condition as it should be 
common sense that this volume of flux is not acceptable. Then again, 
common sense doesn't seem to be as common as it used to be. I would be 
very uncomfortable with an assembler who would knowingly send me an 
assembly with this condition. Hopefully this was just a mistake that 
slipped thru inspection/audit.

Dave



From:   "Thayer, Wayne - IS" <[log in to unmask]>
To:     <[log in to unmask]>
Date:   11/07/2012 07:37 AM
Subject:        Re: [TN] Limits on flux residue
Sent by:        TechNet <[log in to unmask]>



Thanks to all for initial comments.  I finally got some pictures so we can 
appreciate the magnitude of what I've brought up.

http://ipc-technet.groupsite.com/gallery/24561

Are we using the IPC photo gallery anymore?  The last collection before I 
added these pix was about a year ago!  Has Steve totally stolen their 
market?

As the photos show, this is an extreme case, and yes, I don't see how this 
could have been done without rework being involved, but even then I don't 
know how so much flux was jammed beneath this part.  For removal, the 
device was rudely milled/bludgeoned to death with a milling machine, and 
then I picked at it with an Xacto until I felt real comfortable with what 
was going on.  I removed a good size chunk of the flux towards the left 
side of the photos, so the approximately 60% fill seen now is lower than 
how this board was shipped to me.  So the original "void ratio" was better 
than void ratios in solder for most QFN center pads!

I think IPC 610 should have a picture in it similar to the ones I've 
submitted as an example of a rejectable defect under all classes.

Wayne Thayer

From: [log in to unmask] [mailto:[log in to unmask]]
Sent: Tuesday, November 06, 2012 8:27 AM
To: TechNet E-Mail Forum; Thayer, Wayne - IS
Subject: Re: [TN] Limits on flux residue

Hi Wayne - no, the JSTD-001 committee has not addressed that aspect of No 
Clean processing because there are a number of product use environment 
influences and process parameters that come into play on what is 
acceptable and unacceptable. Your description would lead me to believe 
that someone has taken extreme liberty in calling something a "no clean" 
process. One of the things that we have found most interesting in the 
implementation of a no clean process for a couple of our products is that 
many folks believe "no clean" is a sloppy process and you can leave flux 
residue anywhere on the assembly in uncontrolled quantities. But the 
reality is that "no clean" solder processing requires very careful control 
of what/how much/where you allow flux residues to exist. In my view, a "no 
clean" process actually is a much tighter controlled process than a 
process that utilizes cleaning to insure that product functionality is not 
impacted.

Dave Hillman
Rockwell Collins
[log in to unmask]<mailto:[log in to unmask]>



From:        "Thayer, Wayne - IS" <[log in to unmask]<
mailto:[log in to unmask]>>
To:        <[log in to unmask]<mailto:[log in to unmask]>>
Date:        11/05/2012 05:52 PM
Subject:        [TN] Limits on flux residue
Sent by:        TechNet <[log in to unmask]<mailto:[log in to unmask]>>
________________________________



Is there a spec somewhere which limits the amount of residue allowed for 
no clean processing?  I just saw a board where a BGA was about 70% 
"underfilled" by flux residue.  No, this was not a flux/underfill product! 
 A quick look at JSTD-001 Section 8 didn't seem to have specific guidance 
on this condition.

Wayne Thayer

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