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Date: | Wed, 7 Nov 2012 17:30:39 -0600 |
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Hi Wayne - that is a ridiculous volume of flux and I doubt that any
specification requirement could prevent this condition as it should be
common sense that this volume of flux is not acceptable. Then again,
common sense doesn't seem to be as common as it used to be. I would be
very uncomfortable with an assembler who would knowingly send me an
assembly with this condition. Hopefully this was just a mistake that
slipped thru inspection/audit.
Dave
From: "Thayer, Wayne - IS" <[log in to unmask]>
To: <[log in to unmask]>
Date: 11/07/2012 07:37 AM
Subject: Re: [TN] Limits on flux residue
Sent by: TechNet <[log in to unmask]>
Thanks to all for initial comments. I finally got some pictures so we can
appreciate the magnitude of what I've brought up.
http://ipc-technet.groupsite.com/gallery/24561
Are we using the IPC photo gallery anymore? The last collection before I
added these pix was about a year ago! Has Steve totally stolen their
market?
As the photos show, this is an extreme case, and yes, I don't see how this
could have been done without rework being involved, but even then I don't
know how so much flux was jammed beneath this part. For removal, the
device was rudely milled/bludgeoned to death with a milling machine, and
then I picked at it with an Xacto until I felt real comfortable with what
was going on. I removed a good size chunk of the flux towards the left
side of the photos, so the approximately 60% fill seen now is lower than
how this board was shipped to me. So the original "void ratio" was better
than void ratios in solder for most QFN center pads!
I think IPC 610 should have a picture in it similar to the ones I've
submitted as an example of a rejectable defect under all classes.
Wayne Thayer
From: [log in to unmask] [mailto:[log in to unmask]]
Sent: Tuesday, November 06, 2012 8:27 AM
To: TechNet E-Mail Forum; Thayer, Wayne - IS
Subject: Re: [TN] Limits on flux residue
Hi Wayne - no, the JSTD-001 committee has not addressed that aspect of No
Clean processing because there are a number of product use environment
influences and process parameters that come into play on what is
acceptable and unacceptable. Your description would lead me to believe
that someone has taken extreme liberty in calling something a "no clean"
process. One of the things that we have found most interesting in the
implementation of a no clean process for a couple of our products is that
many folks believe "no clean" is a sloppy process and you can leave flux
residue anywhere on the assembly in uncontrolled quantities. But the
reality is that "no clean" solder processing requires very careful control
of what/how much/where you allow flux residues to exist. In my view, a "no
clean" process actually is a much tighter controlled process than a
process that utilizes cleaning to insure that product functionality is not
impacted.
Dave Hillman
Rockwell Collins
[log in to unmask]<mailto:[log in to unmask]>
From: "Thayer, Wayne - IS" <[log in to unmask]<
mailto:[log in to unmask]>>
To: <[log in to unmask]<mailto:[log in to unmask]>>
Date: 11/05/2012 05:52 PM
Subject: [TN] Limits on flux residue
Sent by: TechNet <[log in to unmask]<mailto:[log in to unmask]>>
________________________________
Is there a spec somewhere which limits the amount of residue allowed for
no clean processing? I just saw a board where a BGA was about 70%
"underfilled" by flux residue. No, this was not a flux/underfill product!
A quick look at JSTD-001 Section 8 didn't seem to have specific guidance
on this condition.
Wayne Thayer
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