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October 2012

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Subject:
From:
Joyce Koo <[log in to unmask]>
Reply To:
TechNet E-Mail Forum <[log in to unmask]>, Joyce Koo <[log in to unmask]>
Date:
Wed, 31 Oct 2012 11:22:11 +0000
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where you suspect your contamination located? 
--------------------------
Sent using BlackBerry


----- Original Message -----
From: Gönül Özden [mailto:[log in to unmask]]
Sent: Wednesday, October 31, 2012 06:09 AM
To: [log in to unmask] <[log in to unmask]>
Subject: [TN] ionic  contamination measurement

Hello,
 
I need to know which method in ionic contamination measurement will be more reliable and convenient for military application static process or dynamic process. IPC-TM-650 accept both metodologies. 
Can someone of you have an experience on this issue?

Regards

Gonul Ozden




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