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October 2012

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Subject:
From:
Ioan Tempea <[log in to unmask]>
Reply To:
TechNet E-Mail Forum <[log in to unmask]>, Ioan Tempea <[log in to unmask]>
Date:
Tue, 23 Oct 2012 12:41:16 +0000
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Dear Technos,

I guess you had all already guessed where I'm trying to get at: I have Cu diffusion at the surface of the Au on some connecting pins and can't assess the effect on long term reliability.

So here comes the second question: are there any studies / rules of thumb that could say how much of the Au surface may be lost without any negative impact on the functionality? I definitely got the message that everything is application related, but just trying my luck...

Or, anybody has an idea how could I test the long term reliability in this situation?

Thanks,

Ioan Tempea, ing.
Ingénieur principal de fabrication / Senior Manufacturing Engineer
[signature002]<http://www.digico.cc/>

950 RUE BERGAR, LAVAL, QC, H7L 5A1<http://g.co/maps/2gh3f>
T+ 1 (450) 967-7100, EXT244
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Entreprise manufacturière / Gestion du capital humain


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