TECHNET Archives

February 2012

TechNet@IPC.ORG

Options: Use Monospaced Font
Show Text Part by Default
Show All Mail Headers

Message: [<< First] [< Prev] [Next >] [Last >>]
Topic: [<< First] [< Prev] [Next >] [Last >>]
Author: [<< First] [< Prev] [Next >] [Last >>]

Print Reply
Subject:
From:
Steven Kelly <[log in to unmask]>
Reply To:
TechNet E-Mail Forum <[log in to unmask]>, Steven Kelly <[log in to unmask]>
Date:
Fri, 17 Feb 2012 22:13:14 +0000
Content-Type:
text/plain
Parts/Attachments:
text/plain (4 lines)
Hi All,
Do you think it is possible to do Moire Inferometry on the ZIF end of a flex circuit to measure the co-planarity of a HASL finish across the width of the ZIF as well as along the finger length? My concern among other things is how to keep the ZIF end flat while doing the measurement?
Thanks. Steve Kelly

ATOM RSS1 RSS2