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February 2012

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Subject:
Re: Congratulations, Mr.Hillman!
From:
Karen Tellefsen <[log in to unmask]>
Reply To:
TechNet E-Mail Forum <[log in to unmask]>, Karen Tellefsen <[log in to unmask]>
Date:
Fri, 3 Feb 2012 13:10:21 -0500
Content-Type:
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Good work, Dave.

Karen Tellefsen - Electrical Testing
[log in to unmask]
908-791-3069



                                                                            
                                                                            
                                                                            
   [TN] Congratulations, Mr.Hillman!                                        
                                                                            
                                                                            
   Jack Olson                                                               
              to:                                                           
                 TechNet                                                    
                                                           02/03/2012 12:38 
                                                                         PM 
                                                                            
                                                                            
                                                                            
                                                                            
   Sent by:                                                                 
          TechNet <[log in to unmask]>                                         
   Please respond to TechNet E-Mail Forum, Jack Olson                       
                                                                            
                                                                            
                                                                            






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http://circuitsassembly.com/cms/news/12373-shea-wins-best-of-conference-presentation-at-smtai

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