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October 2011

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Subject:
From:
Inge Hernefjord <[log in to unmask]>
Reply To:
TechNet E-Mail Forum <[log in to unmask]>, Inge Hernefjord <[log in to unmask]>
Date:
Mon, 3 Oct 2011 04:25:35 -0700
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If that pedal accelerates tin whiskers, you may retard the growth by using
the brake pedal.
American logic.
/Inge
PS. I'm afraid I just trigged Dewey. Let's see if he can resist.

2011/10/2 Bob Landman <[log in to unmask]>

> Some of us here attended the 5th CALCE  international symposium on tin
> whiskers http://www.calce.umd.edu/symposiums/ISTW2011.htm where one  of my
> former professors, Dr. Henning  Leidecker, talked about the tin whiskers he
> and the others at NASA Goddard  discovered in Toyota Camry accelerator
> pedals.
> =====================================
> CALCE Prediction of Potential Failures Risks in Toyota  Vehicles Confirmed
> by NASA Scientists
> Investigations of Toyota vehicles have revealed tin whiskers in a critical
>  component of their vehicle engine control system. At the September CALCE
>  Conference on Tin Whiskers, Henning Leidecker and his team at NASA's
> Goddard  Space Flight Center, who are recognized experts on electronic
> device failure and  tin whiskers, presented their studies of tin whiskers on
> Toyota vehicles. They  determined that the risk of failure due to tin
> whisker shorting in affected  Toyota vehicles can be on the order of 50 to
> 150 per million. This figure agrees  with the number reported in a recently
> published scientific journal article  [Sood et al.] written by CALCE
> researchers Bhanu Sood, Michael Osterman, and  Michael Pecht. They assessed
> the probability of a tin whisker-induced electrical  short to be 140 per 1
> million, based on whisker growth statistics.
> Tin whiskers are known to grow from tin-finished surfaces and have been
>  associated with costly failures of electronic systems. Linking tin whiskers
> to  electronic product failure is often extremely difficult. Tin whiskers
> that  bridge across terminations can create electrically resistive pathways.
> And since  whiskers shift under an electrostatic field and can melt when the
> electrical  current is drawn, they cause intermittent electrical behavior in
> systems.
> Figure 1 Tin whiskers on the edge of an acceleration position sensor board
>  connection terminal in a 2002 Toyota Camry.
>
> http://www.autosafety.org/sites/default/files/imce_staff_uploads/whisker%20news%20article-update-review%20%282%29.pdf
> Considering the number of vehicles on the  road, the presence of tin
> whiskers in engine control components presents a  significant safety hazard.
> For this reason, best practices for electronics  design stipulate that tin
> not be used as a plating material. It is very  questionable why the National
> Highway Traffic Safety Administration--with its  stated mission to --save
> lives, prevent injuries and reduce economic costs due to  road traffic
> crashes, through education, research, safety standards, and  enforcement
> activity||--has not come out with a requirement that no electronics  use pure
> tin as a material component, since the potential for tin whiskers  presents
> an unreasonable and unnecessary risk.
> B. Sood, M. Osterman and M. Pecht,  Tin Whisker Analysis of Toyota's
>  Electronic Throttle Controls, Circuit  World, Vol. 37, No. 3, 2011, pp. 4-9
> =====================================================
>
> (One of my colleagues,  Dr. Gordon Davy, presented a talk on our process:
>  "Whisker-Impenetrable Metal Cap Process for Electronic Assemblies"  )
>
> Bob Landman
> Managing  Partner
> LDF  Coatings, LLC.
> [log in to unmask]
> www.ldfcoatings.com
>
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