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February 2011

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Subject:
From:
Werner Engelmaier <[log in to unmask]>
Reply To:
TechNet E-Mail Forum <[log in to unmask]>, Werner Engelmaier <[log in to unmask]>
Date:
Wed, 2 Feb 2011 15:36:32 -0500
Content-Type:
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Hi Inge,
Those were 'the good old days'—well. very good in terms of resources and freedom, not so good when it came to the organization [I still have an occasional nightmare].
This equation has been somewhat updated since, it is in IPC-D-279 and I teach it in some of my workshops.
You sure have an incredible memory and/or a incredibly organized reference library.
Werner

 

 


 

 

-----Original Message-----
From: Inge Hernefjord <[log in to unmask]>
To: TechNet E-Mail Forum <[log in to unmask]>; Werner Engelmaier <[log in to unmask]>
Sent: Wed, Feb 2, 2011 3:21 pm
Subject: Re: [TN] IPC-TM-650 2.6.8, Thermal Stress, PTHs


 
W, I have a old report, Predicting Plated-Through-Hole Reliability in a High Temperature Manufacturing Environment, in which one equattion is ' Engelmaier eq.'
The report is written by DEC . If it could be of any help, I can send a copy, alt. you may find it in IEEE'S ARCHIVE.
 
 
 
Inge


 
On 1 February 2011 20:44, Werner Engelmaier <[log in to unmask]> wrote:

 Hi Victor "X" (?),

 Why would you want to "shock the IP layers"? What would that accomplish?
What you want to do, and this test does, is expose your PCB to elevated temperatures to get an idea as how it is holding up in temperature excursions during soldering operations and subsequent operational T-cycles.
Werner







-----Original Message-----
From: Victor Hernandez <[log in to unmask]>
To: [log in to unmask]
Sent: Tue, Feb 1, 2011 2:20 pm
Subject: [TN] IPC-TM-650   2.6.8,  Thermal Stress,  PTHs





Folks,



  As I understand the above mentioned Test Method is reserve for PTH

product/boards.   What application is used when all of the PTH are filled with

non conductive maters, plated over, planarized and covered with solder mask.   I

don't see how the above test would shock the IP layers.



"X"





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