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Subject:
From:
Randall L Bock <[log in to unmask]>
Reply To:
TechNet E-Mail Forum <[log in to unmask]>, Randall L Bock <[log in to unmask]>
Date:
Wed, 16 Dec 2009 10:28:46 -0500
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Lee,

I totally agree, and it is sometimes difficult when training new operators that they and their manager understand what you have said.


Randy Bock  Sr.
Quality Engineer / Product Quality Manager
Enterprise Quality Assurance
(Email) [log in to unmask]
Newtown Building 2
203 270-4931  (NT2)
8-426-4931
(Fax)203-270-4982
Shelton 27 WV  203-922-4014
(Cell) 203 300-3547



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-----Original Message-----
From: TechNet [mailto:[log in to unmask]] On Behalf Of Chris Mahanna
Sent: Wednesday, December 16, 2009 10:03 AM
To: [log in to unmask]
Subject: Re: [TN] Lead Free Analyzers

Lee,
To the best of my knowledge, the definitive public information on the subject is from NPL.  It's free from their website.  See abstract below.
Chris

Chris Mahanna
Robisan Lab

Title: 
XRF measurement of residual materials in electronics. 
Author: 
Wickham, M, Hunt, C 

(An asterisk (*) after an author's name indicates a non-NPL author)

Source: 
MAT 4, August 2007 
ISSN: 1754-2979 
Abstract: 
The aim of this study was to assess the suitability of using X-ray fluorescence (XRF) systems for screening electronics parts in two applications - compliance with RoHS regulations, and tin whisker mitigation. Fifteen XRF systems were evaluated using typical electronic components and assemblies, ranging from contaminated plastic components, through bulk solder alloys, to solder joints and solder-terminated components. The results indicate that while PIN (semiconductor diode) and SiLi detector based systems are suitable for RoHS compliance measurements in plastics and solders, proportional counter based systems are not. XRF systems using PIN or SiLi detectors generally proved efficient at distinguishing between non-compliant components (containing typically 2000+ppm of restricted substances) and compliant components (typically <500ppm of restricted substances). For levels between 500ppm and 2000ppm, the use of additional techniques may be required to provide discrimination. The PIN or SiLi detectors also proved efficient at distinguishing compliant and noncompliant systems containing >1000ppm cadmium. Below this level, however, additional techniques may again be required to provide discrimination. The lower RoHS limit for cadmium of 100ppm did result in a number of false detections for this element. Proportional counter based systems were capable of registering the presence of RoHS-banned elements at levels >3% e.g. such as found in some plastics. Below this level, however, their ability to detect any banned substances was questionable, and their use for such applications is not recommended. For tin whisker mitigation applications, lead levels in excess of 4% are required for solder samples. All the systems successfully detected lead at or above this level, providing the sample size was large enough to fill the measurement window. Indeed, all systems proved capable of detecting/measuring lead levels above 1% in solder. It is important to remember that the use of these instruments for both the applications studied (RoHS compliance, or tin whisker mitigation) requires the operators to have both a thorough knowledge of the instrument themselves, and a good understanding of the structure and materials involved in the test samples These are required to prevent incorrect interpretation of the data provided i.e. incorrect indications of RoHS compliance, or of tin whisker mitigation (e.g. for samples having lead in base materials beneath a lead-free metalisation). Recommendations on instrument practice to obtain meaningful, repeatable results are given.

-----Original Message-----
From: TechNet [mailto:[log in to unmask]] On Behalf Of Lee Whiteman
Sent: Tuesday, December 15, 2009 9:40 AM
To: [log in to unmask]
Subject: Re: [TN] Lead Free Analyzers

If you google "Portable XRF Analyzers", you would find several.

Good luck.

Lee Whiteman, PMP
Senior Member Engineering Staff
L-3 Communications East
Telephone: (856) 338-3508
FAX: (856) 338-2906
E-Mail: [log in to unmask]
 

-----Original Message-----
From: TechNet [mailto:[log in to unmask]] On Behalf Of Leland Woodall
Sent: Tuesday, December 15, 2009 8:42 AM
To: [log in to unmask]
Subject: [TN] Lead Free Analyzers

Folks,

Since we're on the subject of RoHS, can someone please recommend a good, accurate, handheld lead free analysis unit, and its approximate cost?

We have a SEM and an XRF, but was wondering if we might be able to identify something a bit more portable to use in areas besides the lab.

Thanks,

Leland

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