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May 2009

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Subject:
From:
Werner Engelmaier /* <[log in to unmask]>
Reply To:
TechNet E-Mail Forum <[log in to unmask]>, [log in to unmask]
Date:
Wed, 20 May 2009 09:08:20 -0400
Content-Type:
text/plain
Parts/Attachments:
text/plain (2917 lines)
 Graham,
With some luck, Dewey is slacking off.
Werner


 


 

-----Original Message-----
From: [log in to unmask]
To: [log in to unmask]; [log in to unmask]
Sent: Wed, 20 May 2009 7:06 am
Subject: RE: [TN] Underfill Pass/fail criteria






















Well, if I knew I was not clear on it does that make me just half
dumb, or full dumb???  Dewey, cut me some slack!!!



 



Thanks Werner.



 



regards, 

 - Graham 






From: [log in to unmask]
[mailto:[log in to unmask]] 

Sent: Tuesday, May 19, 2009 4:29 PM

To: Collins, Graham (FN) @ ESI; [log in to unmask]

Subject: Re: [TN] Underfill Pass/fail criteria






 






Hi Graham,

You are reading it incorrectly.









If you
compare the results in Fig. 2 with those in Figs. 3 and 4, it is clear that
snap-curing underfill give better fatigue life improvements [do not ask me why,
I don't know].

Werner









 






-----Original Message-----

From: [log in to unmask]

To: [log in to unmask]; [log in to unmask]

Sent: Tue, 19 May 2009 3:17 pm

Subject: RE: [TN] Underfill Pass/fail criteria












Werner, my apologies - if I have offended it was not intended –
where meaning has not been understood the fault is mine.  Well, that and
plus that just as I think I’m understanding the intent of what you’ve written,
someone rushes into my cube and distracts me with an inane 
fact.









 









The one thing I’m not clear on – you seem to be saying tha t slow
curing resins give a better fatigue life, but that this doesn’t translate into
real-world reliability improvement?  Or am I reading it incorrectly?









 









regards, 

 - Graham Collins









 












From: [log in to unmask]
[mailto:[log in to unmask]]


Sent: Tuesday, May 19, 2009 4:01 PM

To: [log in to unmask];
Collins, Graham (FN) @ ESI

Subject: Re: [TN] Underfill Pass/fail criteria












 












Hi Graham,

The English language is wonderfully adapt to explain things—that is why it has
displaced French as the language of diplo macy and German as the language of
technology—it is now a great lingua franca.

I try [nobody is perfect, as my wife reminds me all the time], but sometimes I
do not succeed in conveying the meaning properly.

What do I need to clarify, if not to say dumb down?

Werner















 















 












-----Original Message-----

From: Graham Collins <[log in to unmask]>

To: [log in to unmask]

Sent: Tue, 19 May 2009 2:31 pm

Subject: Re: [TN] Underfill Pass/fail criteria







For the rest of us, it's possible to get a copy of Werner's article at:























http://www.globa
lsmt.net/index.php?option=com_content&task=view&id=33&Itemid=65















































Now if only I could get him to explain it to me in small words...  :-)















































regards,























 - Graham Collins















































-----Original Message-----























From: TechNet [mailto:[log in to unmask]] On Behalf Of Werner Engelmaier /*























Sent: Tuesday, May 19, 2009 3:18 PM























To: [log in to unmask]























Subject: Re: [TN] Underfill Pass/fail criteria







































































 Hi Bev,























Clearly, the most important SJs that need to be covered are the outermost rows 























and the rows directly underneath the die outline—this later is most important 























for face-up BGAs and CSPs.







=0

A











I do not know if one can
 write generally applicable pass/fail criteria [because, 























what else, 'It depends'].























I ave attached a column of mine on underfills [sorry for the rest of you for 























whom IPC strips the attachment], Engelmaier, W., “Reliability Improvement with 























Underfill,” Global SMT & Packaging, Vol. 6, No. 3, March202006, pp. 66-67. 























Werner







































































 







































































 















































-----Original Message-----























From: Bev Christian <[log in to unmask]>























To: [log in to unmask]























Sent: Tue, 19 May 2009 1:51 pm























Subject: [TN] Underfill Pass/fail criteria































































0A






































































































































































































TechNetters,























I am aware of J-STd-030 "Guideline for Selection & Application of























Underfill" and the existence of IPC standards committee 5-24F "Underfill























Adhesives for Flip Chip Applications".  There is nothing in IPC-A-610D























about underfills.  I have taken Brian Toleno's very good course on























underfills, but on going back and looking at the CD, I don't see























anything on pass/fail criteria.  Do any of you know of an international























standard (American, IEC, Japanese) with pass/fail criteria for cured























unde

rfills?















































I am particularly interested in what said standard (or
 anything you want























to tell me) says about coverage and voiding.















































Bev























RIM















































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